Abstract In-situ transmission electron microscopy (TEM) holders that employ a chip-type specimen stage have been widely utilized in recent years. The specimen on the microelectromechanical system (MEMS)-based chip is commonly prepared by focused ion beam (FIB) milling and ex-situ lift-out (EXLO). However. the FIB-milled thin-foil specimens are inevitably contaminated with Ga+ ions. https://allfixelectricales.shop/product-category/coffee-machine-belt/