As a key technology to study the physical mechanism of single event effects (SEEs) and to identify the sensitive area of microelectronic devices. heavy ion micro-beam irradiation has been paid more and more attention by researchers. Single ion hit (SIH) is an important part of heavy ion micro-beam irradiation. which could reduce the number of incident ions to just one through a series... https://www.roneverhart.com/Western-Digital-Ultrastar-DC-HC550-WUH721816ALE6L0-0F38460-16TB-7-2K-RPM-SATA-6Gb-s-512e-ISE-3-5in-Hard-Drive/